Professor Geraint Williams is author of 60+ peer-reviewed international journal papers, 70+ conference papers and the co-originator of 6 patents in areas ranging from gas sensors, aqueous corrosion of metals to the photochemistry of semiconductor colloids and powder dispersions.
World-leading expert in the use of the advanced electrochemical scanning techniques such as the Scanning Kelvin probe (SKP) technique both to quantify organic coating integrity and to visualise fingerprints on metal surfaces.
Acted as consultant on SKP instrumentation to several international companies including General Electric Global Research, Corus and Tokyo Electric Power Co.
Collaboration with Corus and the Home Office he supervises 5 doctoral and 1 masters students on forensic science, coatings and light alloy corrosion based research projects.
Invited lectures on novel anti-corrosion coating technologies at numerous international conferences, including the prestigious 2008 Gordon Research Conference in aqueous corrosion (New Hampshire, USA), NACE Corrosion 2010 (San Antonio) and 2009 (Atlanta USA), the 2009 European Coatings Conference (Berlin) and Eurocorr 2004 (Nice). In the field of fingerprint detection he has been an invited speaker at the 2008 Institute of Materials conference on Forensic Materials (London) and the 2009 International Fingerprint Research group meeting held in Lausanne.
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